The combination of opto-electrical measurements in steady-state, frequency and time domain provides deeper insight into the device physics

Main Characteristics

paios_sweep_measurement_parameter

Parameter Sweep

Sweeping means that your measurement is performed several times by changing one or two parameters. Paios allows to graphically check the measurement data easily with a sweep slider.

Data Acquisition and Comparison

Paios is more than a measurement tool. It acquires systematic data of dozens of devices and lets you compare them in its management software. Learn from your experiments without tedious manual processing of data.

User-Defined Signals for Custom-made Experiments

Design your own transient experiments using the Paios signal editor.
A new idea for an experiment can easily be tested.

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Correction of RC-Effects

RC-effects are superimposed on the device current and can significantly disturb transient experiments. Paios provides routines to extract the series resistance and the geometric capacitance of the device.


Flexible Time-Resolution

Flex-res: The time resolution of the transient-measurement is varied logarithmically to obtain a very high dynamic range

Flex-res: The time resolution of the transient-measurement is varied logarithmically to obtain a very high dynamic range

Traditional measurement setups using linear time sampling can resolve only 3 orders of magnitude in time.
Paios performs measurements over 8 orders of magnitude in time, in one shot.

This feature is especially useful for perovskite solar cells. Perovskite solar cells exhibit an extraordinarily broad dynamic range from microseconds to minutes. These time dynamics can be resolved with the feature Flex-Res of Paios.
 


Perovskite: Device Preconditioning

The response of perovskite solar cells depends on the «internal state» of the device prior to the measurement. This leads to hysteresis in the IV curve. Paios can precondition the device with voltage, current, or illumination and perform the experiments directly afterward. This increases the experiment reproducibility.

Use preconditioning to investigate the effect of mobile ions, ferroelectricity, or deep trap sites.

precondition a perovskite solar cell: The voltage adjusts mobile ions prior to a light pulse experiment
preconditioning perovskite solar cells_hysteresis

In our blog “WHY PEROVSKITE SOLAR CELLS WITH HIGH-EFFICIENCY SHOW SMALL IV-CURVE HYSTERESIS” we describe how to study hysteresis effects in perovskite solar cells with a combined experimental and simulation method.


Postprocessing

Paios comes with flexible and user-friendly post-processing routines included. This enables to easily analyze experiments and extract parameters even for novice users.

Charge Carrier Mobility form photo-CELIV

Extract the charge carrier mobility of solar cells using the photo-CELIV experiment.

Doping Density from Dark-CELIV

The dark-CELIV overshoot is integrated (shown in blue) to obtain the doping density.

Phosphorescence Lifetime from TEL

Extract the luminescence lifetime of OLEDs from EL turn-off.

Permittivity from Voltage Pulse

A voltage pulse in reverse allows to extract the capacitance and the permittivity.

 

Equivalent Circuit Fitting

Impedance spectroscopy data is often analyzed with equivalent circuits. In Paios all kinds of circuits can be fitting to the measurement data.

Charge Carrier Mobility from Mott-Gurney

In monopolar devices, the charge carrier mobility can be extracted from an IV-curve using an SCLC-fit.

Doping Density from Mott-Schottky

With a Mott-Schottky analysis, the doping density of a semiconductor can be extracted.

Basic Solar Cell Parameters

Extract short-circuit current, open-circuit-voltage, the MMP, and the fill factor of a solar cell.

 

Mobility from Transient Electroluminescence

Extracts the mobility from the delay time between voltage and EL turn-on of an OLED.

Series Resistance from Impedance

A very reliable method to extract the series resistance and the geometric capacitance from impedance data.

Recombination from photo-CELIV

Extracts the recombination coefficient from photo-CELIV or charge extraction measurement with varied delay-time.

Transport-Time from IMPS

Easily determine the IMPS transport-time that describes how fast charges reach the contacts.


Automated Fitting - Setfos/Paios Integration

Many electrical parameters of organic, perovskite and hybrid devices cannot be determined easily. Comprehensive device modeling is required to extract these parameters. Paios does the job for you. The parameter fitting routine optimizes simulation parameters to meet defined targets and calculates the parameter correlation to check the quality of the fit.
Use Setfos-Paios Integration to extract the following parameters:

  • Electron and hole mobility

  • Recombination efficiency or charge carrier lifetime

  • Charge injection barriers

  • Built-in voltage / HOMO / LUMO

  • Trap density

  • Trap depth

  • Doping density

  • Permanent dipole moments

  • Series resistance

  • Electrical permittivity

  • Emitter lifetime (OLED)

  • Photon to charge conversion efficiency (PV)

Paios performs global parameter fits on a combination of all available experiments, e.g. capacitance-voltage, impedance, IV-curves, TPV, TPC, photo-CELIV. Our advanced algorithms make it possible to get a fitting within a few minutes. Parameter evolution and fit results can be monitored directly during optimization.
The fit quality can be analyzed with the correlation matrix that is automatically calculated by Paios. The correlation matrix is important to judge how accurate the extracted parameters are.

the change of all extracted parameters is displayed during the data fitting

the change of all extracted parameters is displayed during the data fitting

measurements and simulations are brought to agreement

measurements and simulations are brought to agreement

the correlation matrix shows the quality of the fit

the correlation matrix shows the quality of the fit

We are demonstrating the advantage of a combined experimental (PAIOS) and simulation (SETFOS) approach in our blog “ANALYSIS OF TADF OLED DEGRADATION BY COMBINING ADVANCED CHARACTERIZATION AND SIMULATION”.


Specifications

DC, AC and Transient Analysis
Sampling-rate 60 MS/s
Time resolution 16 ns
Voltage range ± 12 V
Extended voltage range (SMU-module, up to 1 kHz) ± 60 V
Frequency range (Impedance Spectroscopy) 10 mHz to 10 MHz
Minimal resolvable current < 100 pA
Maximum Current 100 mA
LED rise/fall time (PV version) 100 ns
Illumination area (PV version) 1.75 cm2
Measurement resolution 12 Bit
Computer Connection PXI and USB
Weight 15 kg
Dimensions 40 x 30 x 20 cm3
 

 

If you want to know more about PAIOS you can contact us


Examples - Characterization Suite


Learn More

Introduction

Introduction

Modules

Modules

References

References